4003 Hardware Characteristics

Absolute Maximum Ratings

Ambient Temperature Under Bias	0 o C to +70 o C
Storage Temperature	-55 o C to +125 o C
Input Voltage and Supply Voltage with respect to V SS	+0.5 to -20 V
Power Dissipation	1.0 W

Note that stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.

D.C. and Operating Characteristics

\(T_{A}\) = \(0^{o}\) C to \(70^{o}\) C

\(V_{SS}\) - \(D_{DD}\) = 15V ± 5%

\(t_{\phi PW}\) = \(t_{\phi D1}\) = 400nsec

\(t_{\phi D2}\) = 400nsec ; unless otherwise specified.

logic “0” is defined as the more positive voltage (\(V_{IH}\), \(V_{OH}\))

logic “1” is defined as the more negative voltage (\(V_{IL}\), \(V_{OL}\))

SUPPLY Current

Symbol	Parameter	Min	Limit Typical [1]	Max	Unit	Test Conditions
\(I_{DD}\)	Average Supply Current		5.0	8.5	mA	\(T_{WL}\) = \(T_{WH}\) = \(8{\mu}s\) ; \(T_{A}\) = \(25^{o}\) C
Input Characteristics
\(I_{LI}\)	Input Leakage Current			10	\({\mu}A\)	\(V_{IL}\) - \(V_{DD}\)
\(V_{IH}\)	Input High Voltage	\(V_{SS}\) -1.5		\(V_{SS}\) +0.3
\(V_{IL}\)	Input Low Voltage	\(V_{DD}\)		\(V_{SS}\) -4.2	V
I/O Output Characteristics
\(I_{OH}\)	Parallel Out Pins Sinking Current, “1” Level	0.6	1.0		\({\mu}A\)	\(I_{OUT}\) = 0
\(I_{OL}\)	Serial Out Pins Sinking Current, “1” Level	1.0	2.0		\({\mu}A\)	\(V_{OUT}\) - \(V_{SS}\) - 0.5V
\(V_{OL}\)	I/O Output Low Voltage	\(V_{SS}\) -11	\(V_{SS}\) -7.5	\(V_{SS}\) -6.5	V	\(I_{OUT}\) = \(50{\mu}A\)
\(R_{OH}\)	Parallel Out Pins Resistance, “0” Level		400	750	\(k{\Omega}\)	\(I_{OUT}\) = 0
\(R_{OH}\)	Serial Out Resistance, “0” Level		650	1200	\(k{\Omega}\)	\(V_{OUT}\) - \(V_{SS}\) - 0.5V

Capacitance

f = 1MHz; \(V_{IN}\) = 0V; \(T_{A}\) = \(25^{o}C\) Unmeasured Pins Grounded

Symbol	Test	Typ.	Max	Unit
\(C_{IN}\)	Input Capacitance	5	10	pF

Note

[1] Typical values are to \(T_{A}\) = \(25^{o}\) C and Nominal Supply Voltages

[2] For Transistor-transistor logic (TTL) compatibility, use \(12 k{\Omega}\) external resistor to \(V_{DD}\)

Typical D.C. Characteristics

A.C. Characteristics

\(T_{A}\) = \(0^{o}\) C to \(70^{o}\) C

\(V_{DD}\) = 15V ± 5%

\(V_{SS}\) = GND

Symbol	Parameter	Min	Limit Typical	Max	Unit	Test Conditions
\(t_{WL}\)	CP Low Width	6		10,000	\({\mu}sec\)
\(t_{WH}\) [1]	CP High Width	6			\({\mu}sec\)
\(t_{CD}\)	Clock-On to Clock-Off Time	3			\({\mu}sec\)
\(t_{Dd}\)[2]	CP to Data Set Delay			250	ns
\(t_{d1}\)	CP to Data Out Delay	250		1750	ns
\(t_{d2}\)	Enable to Data Out Delay			350	ns	\(C_{OUT}\) = 20pF
\(t_{d3}\)	CP to Serial Out Delay	200		1250	ns	\(C_{OUT}\) = 20pF
\(t_{d4}\)	Enable to Data Out Delay	40		1.0	\({\mu}sec\)	\(C_{OUT}\) = 20pF

Note

[1] \(t_{WH}\) can be any time greater than \(6{\mu}s\)

[2] Data can occur prior to CP

4003 Timing Diagram